Thermo Scientific Hypulse Surface Analysis System
The Thermo Scientific Hypulse Surface Analysis System supplements traditional ion-beam methods with femtosecond laser ablation (fs-LA) technology to offer outstanding X-ray photoelectron spectroscopy (XPS) depth profiling capabilities for thin films, coatings, and multi-layer structures. Fs-LA XPS depth profiling provides even more accurate, efficient, and versatile analysis from the surface to interfaces deep with the sample. This helps you optimize fabrication and the properties of technologically important materials and devices, develop new multi-functional materials, and gain a deeper understanding of material failures.
- Unlock new depths of material analysis with femtosecond laser ablation XPS
- Revolutionizing XPS depth profiling for materials science
- Integrated fs-laser ablation system
- MAGCIS ion source
- High-performance surface analysis
- XPS insulator analysis
- Correlative XPS imaging and surface analysis workflow