Thermo Scientific Spectra 300 Scanning Transmission Electron Microscope
The Thermo Scientific Spectra 300 Scanning Transmission Electron Microscope ((S)TEM) is a high-end aberration-corrected TEM platform engineered for maximum resolution, sensitivity, and analytical depth at the atomic scale. Designed for advanced research in nanotechnology, semiconductors, and quantum materials, the Spectra 300 (S)TEM delivers outstanding performance through cutting-edge electron optics, enhanced stability, and fully integrated spectroscopy solutions. With optimized workflows, high-speed data acquisition, and precise control of imaging conditions, it helps researchers confidently extract deeper insights from complex materials.
- High-resolution STEM imaging performance for all accelerating voltages
- Ultra-high-brightness cold field emission gun (X-CFEG)
- High sensitivity with the Pather STEM detection system
- 4D STEM imaging capabilities across 30 to 300 kV
- EDS and EELS in STEM analytics with Spectra 300 (S)TEM
- In situ (S)TEM capabilities of the Spectra 300 (S)TEM