FTIR Spectrometers FT/IR-X Series

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FTIR Spectrometers FT/IR-X Series


FTIR Spectrometers FT/IR-X Series


FT/IR-4X Research-grade model

It is research-grade in performance, functionality and expandability, and supports high resolution, high S/N, high sensitivity detectors, extending measurement wavenumber, microscopy with linear array detector, and rapid scan. The sample compartment is 200 mm wide, the same width as that of a large model, and can accommodate conventional accessories, including those from third parties.

 

FT/IR-6X/8X High-end model

The FT/lR-6X and FT/lR-8X spectrometers offer a highly configurable optical system applicable to virtually any FTIR application, from simple Mid IR measurement to more complex analysis in the farthest reaches of the electromagnetic spectrum. Research-based measurements are easily performed on the FT/lR-6X or FT/lR-8X spectrometers with options such as full-vacuum, gold-coated optics, rapid & step scan and FT-Raman for more advanced experiments.

Exchangeable elements combined with full automation can be used for spectral measurement from 25,000 cm-1 to less than 20 cm-1 without touching the system. The FT/lR-6X and FT/lR-8X spectrometers are compatible with a range of vacuum and configurable emission ports to perform experiments outside the sample compartment, and are also compatible with our comprehensive range of IR microscopes.

 

Superior performance

  • High signal-to-noise ratio (up to 55,000: 1)
  • High resolution (up to 0.07 cm-1)
  • High wavenumber precision (25,000 to 20 cm-1)

 

Enhanced robustness and reliability

  • Corner-cube mirrors for stable measurement
  • Maintenance-free design
  • Self-diagnosis and validation
  • Base isolation structure

 

Outstanding flexibility

  • Optional detectors
  • Expandable measurement wavenumber range
  • Rapid scan option
  • Large space sample compartment
  • Compatible with microscope

 

Advanced hardware

  • Stable interferometer
  • AccuTrac™ DSP control
  • Stable optical bench
  • Excellent signal-to-noise ratio
  • High resolution measurement

 

Expandable system for user

  • Vacuum option
  • Wavelength range
  • Rapid scan and step scan options
  • IR microscope options

 

Sophisticated software

  • Self-diagnosis function and validation
  • Navigation function
  • Method function